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Sync Generator

Leader LT425D

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Item #:MO13838
Condition:Reference Item
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Model Description:
Component Digital Test Signal Generator

Model Details

4:2:2 Operates in both 525/60 and 625/50 systems Features EDH functions, conforming to SMPTE RS-165 Embedded, internally generated digital-audio test tones 4 serial outputs provided: 3 of the selected test signal with menu-selected EDH and embedded AES/EBU digital audio; fourth is a valuable digital black with menu-selected EDH A precision source of 10-bit 4:2:2 component digital test signals, the LT-425D offers features that make it an ideal choice for production and development applications. These include both embedded AES/EBU digital audio test tones and a dedicated rear panel AES/EBU output. Front panel switching includes 625/50 or 525/60 operation (test signals adapt automatically to suit the system selected) on/off control of Y, Cb and Cr. Menu control of operating options is facilitated with front panel keys and on-screen menus. These include embedded audio channel on/off control and tone frequency selection, ID character and calendar/clock programming, timing advance/delay to ±16 lines, EDH on/off, key lock and control of the moving target and switched pattern displays. The latter are of value in compression testing and controls effect the speed and direction of the moving target and the dwell intervals for sequential switching of selected test patterns. Digital genlock includes front panel advance/delay keys (coarse and fine). The carse keys operate in 3 µs increments, the fine keys in increments of 20 ns. This combined with a ±16 line menu selected advance/delay yields precise, calibrated timing control. Rear panel facilities include a 4 serial outputs (one digital black), 1 parallel output, 1 AES/EBU digital XLR audio output, 2 black burst analog outputs, a pair of genlock loop-through inputs and a 27 MHz clock output.


  • 4 Serial (includes digital black) and 1 Parallel Outputs
  • EDH Codes in Accordance with RP-165
  • 4-Channel AES/EBU Embedded Audio plus
  • Independent AES/EBU Digital Output
  • Compression Tests Include Variable Speed, Direction Controlled Marker and Sequentially Switched Patterns
  • Digital Genlock with Programmed Advance and Delay
  • 27 MHz Clock Outputs
  • 2 Analog Black Burst Outputs
  • 20 Character Programmable ID and Calendar/Clock
  • Test Signals (Adapt Automatically to 625/50 or 525/60 Requirements)
  • SMPTE Color Bars (BBC Bars in 625/50)
  • Combination Color Bars/Ramp (SMPTE or BBC)
  • Flat Field, Red
  • Multiburst, 100% or 60%
  • Multipulse
  • Line sweep, 100% or 60%
  • Bowtie (used with permission of Tektronix, Inc.)
  • 10-Step Staircase
  • Ramp: Oversize, Digital Limit and Shallow (10)
  • SDI Pathological Check Field
  • Full Field 100% Color Bars
  • Full Field 75% Color Bars (EBU Bars in 625/50)

  • Additional Information

    Model Brochure


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